Uncertainty in Reference Values for the Charpy V-notch Verification Program
Splett, JD
Statistical Engineering Division, National Institute of Standards and Technology, Boulder, CO, 80305

Wang, CM
Statistical Engineering Division, National Institute of Standards and Technology, Boulder, CO, 80305

(Received 4 February 2003; accepted 25 August 2005)

Abstract
We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO Guide to the Expression of Uncertainty in Measurement and models the between-machine bias using a Type B distribution. We demonstrate the method using actual data from the Charpy machine verification program.

Keywords:
Charpy V-notch, impact certification program, impact testing, ISO GUM, notched-bar testing, reference specimens, uncertainty

Paper ID: JTE11892
DOI: 10.1520/JTE11892

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Author Splett JD, Wang CM Title Uncertainty in Reference Values for the Charpy V-notch Verification Program Symposium , Committee on