Estimation of the Uncertainty of Fe in Metallic Silicon Determined by Inductively Coupled Plasmas-Atomic Emission Spectroscopy
Wang, D
Quality Control and Measurement Uncertainty, Liaoning Entry-Exit Inspection and Quarantine Bureau, PR China

Wang, S
The Open University of Hong Kong, Hong Kong, PR China

Zhao, S
Statistics, Animal Science, Shenyang Agriculture University, Shenyang, PR China

(Received 7 July 2003; accepted 16 December 2004)

Abstract
This practice provides information for combining standard uncertainties of Fe in metallic silicon determined by the ICP-AES method of the China Inspection and Quarantine (CIQ). The measurand Fe% is determined from other quantities p.q.r … through a functional relationship of the model f: Fe% = f(p.q.r …). The estimated standard deviation associated with the output estimate Fe%, called combined standard uncertainty and denoted by u_c (Fe%), is determined from the estimated standard deviation associated with each larger input estimate (p.q.r …). The combined variance u_c² (Fe%) can be viewed, by the sensitivity coefficients, as a sum of terms with the minor errors omitted.

Keywords:
atomic emission spectroscopy, Horwitz equation, ICP-AES, inductively coupled plasma spectroscopy, metallic, round-robin, silicon, spectroscopy, uncertainty

Paper ID: JTE12061
DOI: 10.1520/JTE12061

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Author Wang, D Affiliation Quality Control and Measurement Uncertainty, Liaoning Entry-Exit Inspection and Quarantine Bureau, PR China Author Wang, S Affiliation The Open University of Hong Kong, Hong Kong, PR China Author Zhao, S Affiliation Statistics, Animal Science, Shenyang Agriculture University, Shenyang, PR China Author Wang DW, Wang SW, Zhao SQ Title Estimation of the Uncertainty of Fe in Metallic Silicon Determined by Inductively Coupled Plasmas-Atomic Emission Spectroscopy Symposium , Committee on