Use of Scanning Electron Microscopy (SEM) to Identify Cuts and Tears in a Nylon Fabric
Stowell, LI
Forensic biologist, Criminalistics and Forensic and Biology Section, Chemistry Division, Department of Scientific and Industrial Research, Petone, New Zealand.


Abstract
Scanning electron microscopy (SEM) micrographs were obtained for fiber ends of a nylon fabric which had been experimentally cut with a scalpel or scissors, or torn by force. In the nylon fabric used, these three types of damage were identifiable on the basis of features of the fiber ends.

Keywords:
clothing damage, criminalistics, cuts and tears, fabrics, fiber end surfaces, forensic science, microscopy, nylon, scanning electron microscopy (SEM), textiles

Paper ID: JFS354900947

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Author Stowell LI, Card KA Title Use of Scanning Electron Microscopy (SEM) to Identify Cuts and Tears in a Nylon Fabric Symposium , Committee on